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Microprocessors and Microsystems > 2018 > 61 > C > 1-10
Microelectronics Reliability > 2017 > 78 > C > 205-211
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 10 > 2700 - 2713
IEEE Journal of Solid-State Circuits > 2017 > 52 > 7 > 1863 - 1875
IEEE Journal of Solid-State Circuits > 2016 > 51 > 4 > 930 - 942
IEEE Micro > 2016 > 36 > 2 > 6 - 7